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Award-Winning Defect Classification System.
Leica Microsystems (111 Deer Lake Rd., Deerfield, IL; Tel: 847/405-7026) received the Editor's Choice Best Product Award, presented annually by Semiconductor International, for their INS 3000 ADC NT, an industry-leading defect classification system. "The award recognizes technologically innovative products that are proven and accepted by the semiconductor industry," says Peter Singer, editor in chief of the publication. "We get input from multiple users for each product to verify that each has successfully shown superior performance in semiconductor manufacturing."
At Leica's worldwide, multiple customer installations, users agree that the Leica INS 3000 ADC NT technology has shown large-yield and cost-saving benefits through reduced cost-of-ownership and fast, reliable defect classification.
This product is a knowledge-based intelligent vision system that acquires ...
- KLA-Tencor Extends its Online Automated Defect Classification Solution with...
- Press release article from: Business Wire July 9, 1997 700+ words
...matching capability for automated defect classification (ADC). With this powerful new...will be able to match automated defect classification schemes both within and between...manufacturers can now develop a defect classification recipe on one system, and then...
- Software facilitates automatic defect classification.(Rudolph's New TrueADC...
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...previously unclassified defects, TrueADC(TM) (Automatic Defect Classification) system has Dynamic Defect Library function that facilitates...the availability of its new TrueADC(TM) Automatic Defect Classification (ADC) system. TrueADC offers a unique Dynamic Defect...
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...DefectID(TM) Delivers Automatic Defect Classification for Random Defects Over the Entire...introduced DefectID(TM), automatic defect classification software that helps improve manufacturing...to expand Electroglas' existing defect classification capabilities to include random...
- Uniphase Announces Automatic Defect Classification Product; Ultrapointe laser...
- Press release article from: Business Wire May 31, 1996 700+ words
...UNPH) today announced the release of a new automatic defect classification (ADC) software accessory product for its laser imaging...important to semiconductor manufacturers as it facilitates defect classification without direct operator evaluation at each defect site...
- Genetic input selection to a neural classifier for defect classification of...
- Magazine article from: Forest Products Journal Estevez, Pablo A. Perez, Claudio A. Goles, Eric July 1, 2003 700+ words
...appropriate set of features for automatic defect classification of radiata pine boards. The study...classification problems, such as wood defect classification, where the best features are unknown...extraction, feature selection, and defect classification. The aim of the image ...
- KLA-Tencor Adds In-Line Defect Classification to Latest-Generation E-Beam Wafer...
- Press release article from: PR Newswire February 19, 2002 700+ words
...wafer inspection system, the eS20XP, now includes in-line automatic defect classification (iADC). This new option speeds time to results for defect classification and review by up to a factor of three when compared to manual review and...
- Applied Materials Developing Next-Generation Automatic Defect Classification...
- Press release article from: Business Wire December 12, 1997 700+ words
...WIRE)--Dec. 12, 1997-- SEM-Based Automatic Defect Classification (ADC) Technology Will Enhance Sub-0.25 Micron Device...Scanning Electron Microscope (SEM)-based automatic defect classification (ADC) system. This high-speed defect review system...
- Rudolph Technologies Announces Milestone Shipments of TrueADC Software for...
- Press release article from: Business Wire October 15, 2007 700+ words
...acceptance of its TrueADC([TM]) Software for automatic defect classification. First released in June 2006, the software now has...of our customers had just about given up on automatic defect classification. Existing products could deliver accuracy only with...
- Improving software testing via ODC: three case studies.(Orthogonal Defect...
- Magazine article from: IBM Systems Journal Butcher, M. Munro, H. Kratschmer, T. March 1, 2002 700+ words
...goals. In this paper, we discuss the use of Orthogonal Defect Classification (ODC), (2) a defect analysis technique, to evaluate...decisions that were being made. Overview of Orthogonal Defect Classification There have been several papers written on ODC that describe...
- ADE Rolls Out its Next-Generation Wafer Inspection Tool; WaferXam System...
- Press release article from: Business Wire June 29, 2005 700+ words
...s latest-generation nano-particle inspection and defect classification tool. This advanced darkfield laser scanning system...process control requires high confidence, real-time defect classification," added Hofemann. "ADE's WaferXam system uses a...