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Atomic Force Microscope suits physical and life sciences.(Veeco Introduces Dimension Edge Atomic Force Microscope System)
Dimension[R] Edge(TM) AFM System provides seamless path from sample placement through optical identification of target region, and from AFM survey mode to zoomed-in feature identification. Closed-loop and drift-compensated stage promotes productivity and accuracy, and low noise levels permit collection of fine details needed for proper material identification. Imaging and single-point spectroscopy capabilities suit many applications, such as characterization of solar and semiconductor devices.
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Streamlined Access to Top AFM Performance
Santa Barbara, CA - Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force …
