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LEXT OLS4000[R] leverages dual confocal technology to offer optical non-contact measuring with full traceability. Optimized to operate at 405 nm, product enables accurate measurement and imaging of angles up to 85[degrees] and accommodates samples that have multiple reflectivity levels. Custom roughness analysis GUI facilitates scanning, stitching, and measurement of samples up to 100 mm long, while Z-drive with movement steps of less than 1 nm enables precise complex depth measurements.
Center Valley, Pa., August 3, 2009 - The LEXT OLS4000[R], the newest laser scanning confocal microscope from Olympus, is the next generation in non-contact …