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Along with 533 Mbps capability, T5385 delivers flexible pin configuration that supports diverse DRAM devices. Tester pin resources can be optimally allocated for efficiency, reduced touchdowns, and improved throughput. Solution also delivers Known Good Die (KGD) for consumer devices, promoting yields for low power DDR2 (LPDDR2) and DDR3 multi-die and stacked devices. Also, high-speed memory repair analysis system is included for DRAM and Flash memory wafer test.
Flexible pin configuration supports diverse DRAMs and improves throughput
SANTA CLARA, Calif., July 28 -- Advantest Corporation today announced availability of its new T5385 memory test system for dynamic random access memory (DRAM) wafer test, offering a parallel test capability of 768 devices -- the highest in the industry, …