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Matrix XRF spectrometers can be configured with gas-proportional, Si-PIN, or silicon drift type detectors and primary beam filtration to provide non-destructive verification of RoHS restricted elements at 1,000 or 100 ppm action level. Able to measure total lead, mercury, chromium, bromine, and cadmium, bench-top systems also allow for lead content quantification. Products are suited for use on plating applications in metal finishing and electronic industries.
HOLBROOK, NY - March, 2007 - Matrix Metrologies, Inc., a supplier of film measurement equipment, introduces a new line of XRF tools for Compliance Testing and Monitoring of …