AccessMyLibrary provides FREE access to millions of articles from top publications available through your library.
Create a link to this page
Copy and paste this link tag into your Web page or blog:
Atomic Force Microscope uses nanoindenter module.(New NanoIndenter(TM) Module for the MFP-3D(TM) Atomic Force Microscope)
Available in Standard and Low Force models, NanoIndenter fits on MFP-3D AFM System head for viewing of sample, and drives nanoindenting tip perpendicular to sample. Tip displacement and force are measured with microscope's optical detector and NPS(TM) Nanopositioning sensors, allowing repeatable imaging, quantitative feature measurement, accurate imaging offsets, quantitative force curves, and precise positioning for manipulation and lithography.
********************
June 12, 2006 (Santa Barbara, CA) Asylum Research, a leading manufacturer of atomic force microscopes (AFMs), announces the availability of the new NanoIndenter module for use with the Asylum …
-
- Nano-partners.(Agilent Technologies Inc. enters into a partnership with...
-
Newspaper article from: Optoelectronics Report
August 1, 2005
700+ words
-
- Module aids in taking conductive AFM measurements.(Asylum Research Announces...
-
Magazine article from: Product News Network
June 7, 2004
700+ words
-
- AFMs come with modulated local thermal analysis option.(Asylum Research...
-
Magazine article from: Product News Network
June 19, 2009
700+ words
-
- AFM: not just for material anymore: atomic-force microscopy finds its footing...
-
Magazine article from: The Scientist
Heyman, Karen
December 5, 2005
700+ words
-
- Microscope takes nanoscale electromechanical measurements.(New Piezo Force...
-
Magazine article from: Product News Network
December 6, 2007
700+ words
