AccessMyLibrary provides FREE access to millions of articles from top publications available through your library.
Create a link to this page
Copy and paste this link tag into your Web page or blog:
HiSpeX is an X-ray fluorescence coating thickness and composition measurement tool designed to measure metal film thickness and compositions along with the determination of elemental composition of solids. It utilizes an electrically cooled silicon pin-diode detector coupled with digital signal pulse processing. The device is suitable for demanding coating applications where films below 1,000 angstroms (4 [micro]in.) are employed and/or binary and ternary …