AccessMyLibrary provides FREE access to millions of articles from top publications available through your library.
A simplified analytical procedure for X-ray fluorescence analysis of cements and associated raw materials
This article describes the theoretical background and practical approach to the application of a |Wide Range Oxides' software program in conjunction with the Philips range of simultaneous and sequential X-ray fluorescence spectrometers (PW1606, PW1660, X'Cem and PW1480 Series). The use of such a program, based on International Certified Reference Materials, is demonstrated to significantly reduce errors while maintaining a high degree of analytical accuracy.
The technique of X-ray fluorescence analysis (XRF) is widely employed in the cement industry which is in itself typified by having a continuous production process demanding strict day and night control of incoming and outgoing materials. Speed, precision and above all high accuracy are of vital importance for an X-ray spectrometer system to be able to guarantee a reliable input for the optimization of the production process.
It is important to realise, however, that the XRF technique is not an absolute method of analysis. As such it can only reflect the stated chemical accuracy associated with the standards used to calibrate the spectrometer, and whilst every attempt is made by international bodies to prepare chemically analysed bulk standards of the highest quality in terms of …