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IIE Transactions articles from November 2005
This journal publishes original research in the industrial engineering industry, focusing on design and manufacturing, operations and engineering, quality and reliability engineering and scheduling and logistics.
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IIE Transactions archives from November 2005
Cycle-based signal monitoring using a directionally variant multivariate control chart system.
November 1, 2005... 1. Introduction
The rapid developments obtained in sensing and computer technologies in recent years has allowed the implementation of online measurement of process variables for manufacturing process monitoring and control. Cycle-based...
Intelligent interactive multiobjective optimization method and its application to reliability optimization.
November 1, 2005... 1. Introduction
In most practical situations involving reliability optimization, there are several mutually conflicting goals such as maximizing the system reliability and minimizing the cost, weight and volume. Sakawa (1978) considered a...
Economic optimization of off-line inspection in a process subject to failure and recovery.
November 1, 2005... 1. Introduction
Most researchers and practitioners in the field of production management agree that process improvement contributes more to product quality than the inspection of process output. However, quality inspection, the focus of...
Economic design of EWMA control charts using regions of maximum and minimum ARL.(exponentially weighted moving average)
November 1, 2005... 1. Introduction
Exponentially Weighted Moving Average (EWMA) schemes were introduced by Roberts (1959) as an alternative to the Shewhart control chart (Shewhart, 1931). The EWMA chart, developed by Lucas and Saccucci (1990), accumulates...
A multivariate EWMA control chart for monitoring process variability with individual observations.(exponentially weighted moving average)
November 1, 2005... 1. Introduction
In many industrial applications the quality of a product is characterized by several correlated variables. For example, in an important process in wafer manufacturing, the chemical mechanical polishing process, the quality...
Run-length distributions of Q-chart schemes.
November 1, 2005... 1. Introduction
Classical control charts such as Shewhart, CUmulative SUM (CUSUM), and Exponentially Weighted Moving Average (EWMA) schemes assume that the values of the process mean and variance are known prior to the start of process...
Dual CUSUM control schemes for detecting a range of mean shifts.(Cumulative sum)
November 1, 2005... 1. Introduction
Statistical Process Control (SPC) tools are widely used in modern industries to monitor and control both manufacturing and service processes. Various control charting schemes have appeared in the literature, including the...
A general accelerated life model for step-stress testing.
November 1, 2005... Notation
[beta] = Weibull shape parameter;
[eta] = Weibull scale parameter;
[[alpha].sub.AF] = acceleration factor;
A = parameter of the Eyring relationship;
B =...
Bayesian reliability assessment of repairable systems during multi-stage development programs.
November 1, 2005... 1. Introduction
Testing programs are often performed during the development phase of a repairable system in order to improve the equipment's reliability level so that a given reliability target can be achieved.
Development programs are...
Methods of Multivariate Analysis, Second Edition.(Book Review)
November 1, 2005... Methods of Multivariate Analysis, Second Edition
Alvin C. Rencher
Wiley-Interscience, New York, NY, 2002, 708 + 22 pages, ISBN 0-471-41889-7
Data sets that are multivariate in nature are common in modern engineering, science, and...
Introduction to Probability and Statistics for Scientists and Engineers.(Book Review)
November 1, 2005... Introduction to Probability and Statistics for Scientists and Engineers
Walter A. Rosenkrantz
McGraw-Hill, 1997, 592 pages, ISBN 0-07-053988-X
The goal of Walter A. Rosenkrantz, as he states in the preface to his book, is to...
Statistical Process Control: The Deming Paradigm and Beyond, Second Edition.(Book Review)
November 1, 2005... Statistical Process Control: The Deming Paradigm and Beyond, Second Edition
James R. Thompson and Jacek Koronacki
Chapman & Hall/CRC 2002, 431 pages and 22 front matter pages, ISBN 1-58488-242-5
Statistical Process Control (SPC)...
Statistical Process Adjustment for Quality Control.(Book Review)
November 1, 2005... Statistical Process Adjustment for Quality Control
Enrique del Castillo
John Wiley & Sons, New York, 2002, 357 pages, ISBN 0-471-43574-0
This book is great because it integrates process adjustment techniques based on Engineering...
Erratum.(Correction Notice)
November 1, 2005... In 'Relationships Among Some Univariate Distributions' which appeared in IIE Transactions 2005, 37(7): p. 653, Figure 2 was mistakenly truncated. Below is the figure in its entirety.
[FIGURE 2 OMITTED]