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IIE Transactions articles from July 2009
This journal publishes original research in the industrial engineering industry, focusing on design and manufacturing, operations and engineering, quality and reliability engineering and scheduling and logistics.
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IIE Transactions archives from July 2009
Detectability study for statistical monitoring of multivariate dynamic processes.(Technical report)
July 1, 2009... 1. Introduction
Statistical Process Control (SPC) plays a very important role in quality and productivity improvement of a manufacturing or service enterprise (Montgomery, 2005). Following SPC methodology, measurements are taken from the...
Sensor fault detection for manufacturing quality control.(Technical report)
July 1, 2009... 1. Introduction
The extensive adoption of sensor technology in manufacturing processes, for example the use of in-line Coordinate Measuring Machines (CMMs) in automotive body assembly processes, has resulted in extensive databases on...
Multiscale mapping of aggregated signal features to embedded time--frequency localized operations using wavelets.
July 1, 2009... 1. Introduction
In general, a complex system consists of multiple embedded operations. Although the separate measurement of individual operation responses can provide explicit diagnostic information for system monitoring, it is often not...
Off-line inspections under inspection errors.
July 1, 2009... 1. Introduction
Quality control is fundamental to the production process. A firm that is not wise enough to implement a quality control program will not survive in today's global competitive environment. If a defective unit reaches a...
An enhanced adaptive CUSUM control chart.(Formula)
July 1, 2009... 1. Introduction
CUSUM control charts find wide industrial use due to the fact that on-line measurement and distributed computing systems are now extensively used in Statistical Process Control (SPC) applications (Woodall and Montgomery,...
Stability analysis of single EWMA controller under dynamic models.(Exponentially Weighted Moving Average)(Technical report)
July 1, 2009... 1. Introduction
Run-to-run (R2R) process control techniques have been extensively studied and are widely utilized in semiconductor manufacturing operations (Sachs et al., 1995; Hamby et al., 1998; Chen and Guo, 2001; Moyne et al., 2001)....