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IIE Transactions articles from December 2007
This journal publishes original research in the industrial engineering industry, focusing on design and manufacturing, operations and engineering, quality and reliability engineering and scheduling and logistics.
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IIE Transactions archives from December 2007
Yield prediction via spatial modeling of clustered defect counts across a wafer map.(Report)
December 1, 2007... 1. Introduction
Integrated circuit (IC) processes and production equipment have undergone tremendous changes over time, fostering rapid technological advances throughout the industry. The semiconductor industry has been able to double the...
Integrated reconfiguration and age-based preventive maintenance decision making.(Report)
December 1, 2007... 1. Introduction
In the 1990s, the manufacturing environment changed from a mass production economy to a customer-driven economy, characterized by aggressive competition on a global scale, high fluctuations in market demand, and rapid...
Determining the number of operational modes in baseline multivariate SPC data.(Statistical Process Control)(Report)
December 1, 2007... 1. Introduction
Multivariate Statistical Process Control (MSPC) is a methodology to monitor manufacturing processes that are characterized by many, perhaps ten to 100, variables that are highly interrelated and that are collected on-line....
Maintenance scheduling for a manufacturing system of machines with adjustable throughput.(Report)
December 1, 2007... 1. Introduction
Traditional maintenance actions consist of repair and replacement activities (Chen and Feldman, 1997; Wang, 2002). However, in addition to these two commonly accepted maintenance actions, there are many other actions that...
Design of EWMA and CUSUM control charts subject to random shift sizes and quality impacts.(Exponentially Weighted Moving Average, Cumulative Sum)(Report)
December 1, 2007... 1. Introduction
Statistical Process Control (SPC) charts are extensively used to detect process excursions and thus prevent the production of defective products. Among the many forms of process excursions, process mean shifts are the...