EE-Evaluation Engineering articles from September 2004

EE-Evaluation Engineering archives from September 2004

The rewards are many.(Editorial)
September 1, 2004... As many of you are aware, especially if you have read this page in previous issues of EE, I'm a proponent of providing more than just the typical science and mathematics classes that routinely are taught to children in many of our schools...

Measurement Computing to discontinue LABTECH.(In the News)
September 1, 2004... All LABTECH products, including NOTEBOOKpro and CONTROLpro, will not be available after Sept. 30, 2004, according to a recent announcement by Measurement Computing. Unlocked copies of the latest version of LABTECH NOTEBOOK and LABTECH CONTROL,...

EMC Seminar/Workshop.(Dates)
September 1, 2004... The EMC Practical Applications Seminar/Workshop will be conducted by D.L.S. Electronic Systems on Oct. 14-15 and 18-19 at the Hilton Hotel in Northbrook, IL. Using a real-life product example, participants will learn how to determine a...

EMC 2005.(Dates)
September 1, 2004... The deadline is Oct. 15 for submitting a 500- to 750-word synopsis of an unpublished paper for the 2005 IEEE International EMC Symposium next August in Chicago. For anonymity, do not include author names or affiliations on the abstract. Submit...

ISTFA 2004.(Dates)
September 1, 2004... The 30th International Symposium for Testing and Failure Analysis, sponsored by the Electronic Device Failure Analysis Society, will be held in November at Worcester's Centrum Centre near Boston, MA. The conference runs Nov. 14-18; the...

Toolkit enables fast measurement sequencing.(Product Briefing)
September 1, 2004... The T&M Toolkit Version 2.0 with Test Automation is an enhanced suite that automates instrument control and measurement sequences for design validation and prototype testing without using complex test executives. It provides a way to gather...

System tests 200-mm wafers at 130-nm node.(Product Briefing)
September 1, 2004... The Model S470 Parametric Test System is optimized for production testing of 200-mm wafers at the 130-nm CMOS node and beyond. It performs a range of I-V and C-V measurements on CMOS, bipolar, and GaAs ICs including automotive and telecom ICs...

Spectrum Analyzer covers to 7 GHz.(Product Briefing)
September 1, 2004... The hand-held Spectrum Master MS2721A Spectrum Analyzer, which covers 100 kHz to 7.1 GHz, analyzes wireless signals including 802.11a, 3G, ultra-wideband, and WiMAX. A new platform helps design, deploy, and optimize the performance of wireless...

Scopes feature segmented memory mode.(Product Briefing)
September 1, 2004... New memory options for the Infiniium 54830 Series of digital storage and mixed-signal oscilloscopes incorporate the company's MegaZoom deep-memory technology with depths up to 128 Mpoints. The scopes feature bandwidths of 600 MHz and 1 GHz and...

IC tester extends pin-count to 5,120 for CDA needs.(Product Briefing)
September 1, 2004... The Magnum[TM] IC ATE, a system compatible with the company's Maverick line of testers, extends the available pin-count in a single head from 512 to 5, 120 pins by putting 12 PCBs worth of electronics into one assembly. The site assembly...

Chassis designed for high-power applications.(Product Briefing)
September 1, 2004... The S32-RH PXI Chassis is a low-profile, 4U system with removable rack flanges and integral rear shock pin receivers to secure mounting within a transit case or 19" rack. The dual-stack, 14-slot PXI backplane, along with its controller and...

A digitizer-based ultrasonic flaw-detection system: small, fast ultrasound reflections require both high-speed and high-resolution digitizing as well as sufficiently deep memory to hold all the data.(PC-Based Test)
September 1, 2004... A company that manufactures ultrasonic flaw-detection systems used for nondestructive testing of laminar steel parts had been performing all measurements using analog circuitry. But to survive in today's competitive market, a modernized...

Testing MEMS at wafer level; although it requires a new generation of test equipment, testing MEMS devices is challenging but not impossible.(MEMS Test)
September 1, 2004... Since the early days of the IC industry, wafer-level test has been possible using precision-controlled wafer probers to step from die to die on the wafer, making electrical contact using needle probes. Over time, the requirements to accomplish...

Testing locomotive boards with PXI: the 20+ PCBs on board diesel locomotives survive a very tough combination of functional and environmental testing before they leave the roundhouse.(Locomotive Electronics Test)
September 1, 2004... Like automobiles, locomotives have become high-tech electronic products that require extensive testing. Today's typical diesel locomotive has 20+ electronic circuit cards, most of which are microprocessor based. The circuit cards perform a...

PXI/VXI Buyers Guide.
September 1, 2004... EE's PXI/VXI Buyers Guide is a comprehensive, up-to-date listing of the companies that specialize in PXI/VXI products and services, including arbitrary waveform generators, embedded controllers, power supplies, mainframes, switches and...

Coping with dispersion at 10 Gb/s: a good dose of electronic dispersion compensation will open your eyes to 10 Gb/s Ethernet's possibilities.(Fiber-Optic Test)
September 1, 2004... Because the wiring plant represents a large part of a network's cost, achieving higher data rates over the existing cables obviously is desirable. To facilitate this, the transitions from 10-Mb/s Ethernet to 100 Mb/s and from 100 Mb/s to 1 Gb/s...

Inline vs. offline device programming: making an informed choice between inline and offline device programming requires an in-depth look at both tangible and intangible manufacturing costs.(Device Programming)
September 1, 2004... Electronic products such as cell phones, DVD recorders, PDAs, and automotive infotainment systems require an enormous amount of user memory compared to a decade ago. The merging of multiple functions--camera, video, MP3, PDA, and cell...

Emissions measurements for alternative powertrain vehicles: increasing demand for vehicles with alternative powertrains prompted this in-depth investigation into today's automotive emissions standards.(EMC Test Equipment)
September 1, 2004... Vehicle manufacturers must satisfy legislative EMC requirements that include radiated emissions measurements for the 30-MHz to 1,000-MHz band. The test methods currently used to validate emissions performance were developed for vehicles powered...

A tool for advanced failure analysis: no longer must you choose either SEM or FIB for failure analysis. Now there's in situ testing using a dual-beam FIB/SEM tool.(Microprobing)
September 1, 2004... Traditionally, testing and failure analysis of integrated circuits (ICs) have been performed by physical electrical probes guided by optical microscopy. However, today's geometries are too small for conventional electrical probing techniques....

Texas to host international ESD Symposium.(ESD Symposium)(Calendar)
September 1, 2004... An interesting mix of cosmopolitan flair and sophistication and Old West charm provides the backdrop for the 2004 EOS/ESD Symposium on Sept. 19-23. The Gaylord Texan Resort and Conference Center, a new facility located in Grapevine near Dallas,...

Image-sensor Test Handler.(ATE)
September 1, 2004... The M4551A Dynamic Test Handler, optimized for high-resolution CCD and CMOS image sensors, examines up to eight devices simultaneously to deliver a maximum throughput of 2,200 devices/h. It accommodates DIPs, SOPs, and LCCs and incorporates a...

Wafer test characterization.(ATE)
September 1, 2004... The 41000 Series Integrated Parametric Analysis and Characterization Environment (iPACE) includes an atto current sense and switch unit (ASU) for automating parametric instruments. The probe-card-based versions use the company's direct docking...

Probe Series to 67 GHz.(ATE)
September 1, 2004... The Dual Infinity[R] Probe Series performs two- or four-port calibrations in GSGSG, GSSG, and SGS configurations and frequencies up to 67 GHz. It ensures low and stable contact resistance, typically [ILLUSTRATION OMITTED]

DFT Platform and Software.(ATE)
September 1, 2004... The WorkBench[TM] Software and the V520[TM] Hardware Platform address DFT applications. WorkBench provides a DFT-Intelligent[TM] environment for validation, debug, and diagnosis of ICs and tests based on structural test methodologies including...

PCI test modules.(ATE)
September 1, 2004... The combination of the PCI32-64 CION Module and the PCI32-64 CION Fixture, new additions to the CION-Module[TM] Series, tests PCI boards and supports 32-b and 64-b architectures. Both accommodate 3.3-V and 5-V targets including automatic...

Integrated Network Analyzer.(Communications Test)
September 1, 2004... The self-contained OptiView Series II Integrated Network Analyzer (INA) features a touch-screen user interface and onboard expert diagnostic systems for handling remote monitoring or portable troubleshooting applications. It supports direct...

Portable 10GbE Tester.(Communications Test)
September 1, 2004... The CMA 5000 10-Gigabit Ethernet Tester provides both lab and field testing capability. For field use, the unit enables network installation and commissioning by performing automated RFC testing including throughput, frame loss, and latency at...

CSP/Micro BGA Test Socket.(Environmental Test)
September 1, 2004... The BGA/CSP Test and Burn-In Socket accommodates device packages up to 55-mm square in applications up to 1 GHz. The socket features a standard molded format suitable for test and burn-in of CSP, MicroBGA, DSP, LGA, SRAM, DRAM, and flash...

Test Chambers.(Environmental Test)
September 1, 2004... The S-3800 Series of Environmental Test Chambers features the 3800 Programmer Controller with an interactive touch-sensitive keypad and a four-line display with 20 characters per line, a built-in Ethernet connection, and a web server for remote...

High bit-rate recorders.(Data Acquisition)
September 1, 2004... The GSR20f and GSR200f Ground Station and Test Cell Recorders capture vibration data created from fatigue and crash testing. The rack-mountable GSR200f 240-Mb/s digital unit acquires multiple streams of data from ground, airborne, and satellite...

Ethernet-based instruments.(Data Acquisition)
September 1, 2004... The DaqBook/2020[R], DaqBook/2001[R], and DaqBook/2005[R] feature multifunction data acquisition and incorporate a packaging scheme with an integrated carrying handle and a mechanism to accommodate more than 40 signal-conditioning expansion...

USB-GPIB Controller.(Data Acquisition)
September 1, 2004... The USB-GPIB Controller Module converts any PC with a USB interface into a full-function, IEEE 488.2 Bus Controller that performs the basic IEEE 488.1 functions such as talker, listener, and system controller. The plug-and-play USB module...

JTAG test development.(Software)
September 1, 2004... The ScanWorks Interconnect Development Station bundles together key capabilities for developing and deploying JTAG tests. It includes the company's PCI-100 Boundary Scan Controller Hardware Kit for integrating ScanWorks into a PC; ScanWorks...

Failure Analysis software.(Software)
September 1, 2004... The Failure Reporting, Analysis, and Corrective Action System (FRACAS) Management System[TM] Version 2.2 provides for gathering and tracking failure data in a centralized database so underlying failure causes can be identified and corrected....

VXI software for data acquisition.(Software)
September 1, 2004... DAC Express 3.0, the latest release of no-programming-required data acquisition software for VXI, features dual sample rates of up to 196 kHz for high-speed channels and 1.5 KS/s/ch scans/s for low-speed data. A display wizard automates...

Benchtop Power Supplies.(Instrumentation)
September 1, 2004... The Ethernet Interface PD Series Linear Power Supplies now include nine benchtop design (BPD) models with local and remote access to power supply controls over LAN/WAN networks, access from multiple computers for multiple user control, and fast...

Measuring Receiver.(Instrumentation)
September 1, 2004... The N5530S Measuring Receiver System, successor to the 8902A, calibrates RF and microwave signal generators and attenuators. It is based on the company's PSA Series (E444XA) Spectrum Analyzers and EPM/EPM-P (E441XA/B) Power Meters, allowing...

Differential Probe.(Instrumentation)
September 1, 2004... The P7380 Active Differential Probe incorporates the Z-Active[TM] architecture, composed of a distributed attenuator topology feeding an active probe amplifier, and interchangeable, configurable Tip-Clip[TM] Probe Tips. The probe features...

Portable Digital Oscilloscope.(Instrumentation)
September 1, 2004... The DL1700E Series Digital Oscilloscopes have 500-MHz bandwidth, two or four channels, a sampling rate up to 1 GS/s, and 8 Mpoints of memory per channel. The scope can be controlled from any network connection using the built-in web server and...

Safety Tester.(Instrumentation)
September 1, 2004... The Elite 2 Safety Tester features eight external analog control ports and eight digital ports and acts as a PLC controller. It powers the DUT using a programmable power source up to 280 V at 10 A and incorporates hipot, insulation, earth bond,...

Hand-Held Spectrum Analyzer.(Instrumentation)
September 1, 2004... The FSH6 Hand-Held Spectrum Analyzer has a frequency range from 100 kHz to 6 GHz and is available in two versions: with an integrated tracking generator and without. It can be used without the generator for installing, optimizing, and servicing...

Switching Frequency Synthesizers.(Instrumentation)
September 1, 2004... The 2200 Series Switching Frequency Synthesizers feature an MTBF of 12,000 hours and operate over the range of 10 MHz to 18.4 GHz with a standard resolution of 1.0 Hz. The synthesizers can step from any frequency to any other frequency, up or...

Digitizer PXI module.(PC Test)
September 1, 2004... The 3U PXI UltraFast UX4540 Card provides two input channels, each with a 16-b A/D for true simultaneous sampling; a 1-MS/s maximum sampling rate; a 500-kHz bandwidth; internal and external triggering; and external clocking. Each channel can be...

Digital I/O Card.(PC Test)
September 1, 2004... The PD2-DIO-128i PCI Card supplies 64 digital inputs and 64 digital outputs, each line with its own optoisolator. The I/Os are configured in fixed banks of 16 lines. The input lines run at 10 kHz maximum and work from a 12-V to 32-V external...

3U PXI Digitizers.(PC Test)
September 1, 2004... The DC140 and DC135 3U Single-Slot PXI Digitizers deliver 1 GHz and 500 MHz bandwidths, respectively, for use in any PXI and CompactPCI chassis. The DC140 provides synchronous sampling on both input channels of 1 GS/s with up to 8 Mpoints of...

PXI Switching Card.(PC Test)
September 1, 2004... The 3U, 32-channel 0000-6622 Discrete Switching Card addresses test applications where UUT response to leaky and dirty input switch contacts must be simulated and verified. It is organized as four banks of eight channels. Each bank can be...

Power Interface Board.(PC Test)
September 1, 2004... The GX7404 3U Power Interface Prototyping Board provides controlled power to interface and test target circuitry. It permits +5-, +3.3-, +12-, and -12-V power outputs present on the PXI motherboard to be switched through a DB25 connector for...

PC Oscilloscopes.(PC Test)
September 1, 2004... The 3000 Series of PC Oscilloscopes that connect to a PC via USB 2.0 debuts with three replacements for traditional benchtop instruments. The PicoScope 3204 offers a 2.5-GS/s sampling rate, 50-MS/s single-shot sampling, 50-MHz analog bandwidth,...