EE-Evaluation Engineering articles from March 2009

EE-Evaluation Engineering archives from March 2009

Strengthen the strong.(technology industries in Silicon Valley)(Editorial)
March 1, 2009... An article in the Feb. 2, 2009, issue of Newsweek puts forth a very difficult-to-imagine supposition--perhaps you may have read it. The article, ''Silicon Valley's Fork in the Road," starts out by asking the question, "Could Silicon Valley...

VNAs deliver frequency coverage to 70 GHz.(PAUL'S PICKS)
March 1, 2009... The VectorStar[TM] MS4640A Vector Network Analyzers feature frequency coverage of 70 kHz to 20 GHz, 40 GHz, and 70 GHz; a dynamic range of 103 dB@ 67 GHz; and measurement speed of 20 [mu]s/point. The two-port engine is compatible with existing...

Embedded tool optimizes remote test and programming.(PAUL'S PICKS)
March 1, 2009... ScanWorks[R] for Embedded Boundary Scan offers system-level JTAG (SJTAG) test, diagnostic, and programming algorithms. It executes routines that conform to the IEEE 1149.1 and the 1149.6 standards for testing high-speed AC coupled differential...

LXI Carrier supports four function cards.(PAUL'S PICKS)
March 1, 2009... The ProDAQ 6100 LXI Function Card Carrier, an LXI Class B device, provides access to up to four ProDAQ Function Cards via a standardized Gigabit LAN interface, a synchronization API, and support for the IEEE 1588 protocol. An optional trigger...

800-W model added to low-profile load series.(PAUL'S PICKS)
March 1, 2009... The LPL Series Low-Profile DC Electronic Load now includes a 1U package with up to 800-W dissipation. The voltage and current ratings can range from 0 ~ 800 VDC/100 ADC. In-rack closed calibration and field-upgradeable firmware are among the...

Probe Cards target 300-mm DRAM wafer testing.(PAUL'S PICKS)
March 1, 2009... The full-wafer-contact Harmony[TM] eXP Probe Cards support testing of 1-GB and 2-GB DDR 2 and DDR 3 devices at design rules ranging to 55 nm and beyond. The platform supports the company's new Rapid-Soak[TM] technology, which maintains thermal...

LCR Meter combines accuracy and high measurement rates.(PAUL'S PICKS)
March 1, 2009... The Model Z9218 LCR Meter features a measurements rate of 12 times/s, 0.02% basic accuracy at 23[degrees]C [+ or -]5[degrees]C, and parameter displays of 320 x 240 graphics on a backlit LCD. It measures inductance, capacitance, and resistance...

PCI Express digitizer cards provide 256-MB signal memory.(PAUL'S PICKS)
March 1, 2009... Two 14-bit digitizer cards for PCI Express have been introduced: the UF2e-4032 with four analog inputs and the UF2e-4031 with two input channels. Each channel has its own 50-MHz ADC for true simultaneous sampling together with six voltage...

Upgradeable-bandwidth scopes have 5-Gb/s pattern triggering.(PAUL'S PICKS)
March 1, 2009... The new DPO70000B Digital Phosphor Oscilloscope (DPO) and the DSA70000B Digital Serial Analyzer (DSA) Series with upgradeable 4-, 6-, 8-, 12.5-, 16-, and 20-GHz bandwidth models provide improved vertical noise performance, flattest frequency...

With Digitizers, the little bits count.(DIGITIZERS)
March 1, 2009... Separation of the elements that have traditionally composed a single instrument is a growing trend within the ATE industry. A good example of user-accessible modularity is the range of synthetic instruments currently being developed to address...

Phase coherent signal testing.(COMMUNICATIONS TEST)(Statistical data)
March 1, 2009... Phase coherence, that is a stable phase relationship between signals, is essential when making measurements that require more than one RF output. While this was once primarily required when evaluating the performance of phased-array antennas in...

Making test lean again.(DESIGN FOR TEST)(Lean manufacturing)
March 1, 2009... Circuit board test, like any step in the PCB assembly process, benefits from lean manufacturing practices that continually improve process steps. If lean manufacturing principles were applied to circuit board test, what would a lean test...

Optimize HALT results with best practices.(HALT)(highly accelerated life test )(highly accelerated stress screen )
March 1, 2009... To gain optimum results from highly accelerated life test (HALT) and highly accelerated stress screen (HASS), it is important to properly plan, implement, document, and take corrective action when embarking on this path. When design defects are...

Instrumentation Buyers Guide.(Buyers guide)
March 1, 2009... EE's 25th annual Instrumentation Buyers Guide is a comprehensive, up-to-date listing of the companies that manufacture or rent instrumentation products. The guide is arranged in two sections. First is a product/company cross-reference. The...

Company guide.(INSTRUMENTATION BUYERS GUIDE)(Calendar)
March 1, 2009... ACCES I/O Products CA 800-326-1649 www.accesio.com AcopianTechnical Co. PA 800-523-9478 www.acopian.com ACR Systems Canada 604-591-1128 www.acrsystems.com Acromag MI 877-214-6267 ...

AOI-AXI duo improves product yield.(AUTOMATED OPTICAL INSPECTION)
March 1, 2009... Automated optical inspection (AOI) and automated X-ray inspection (AXI) have been around for some time in various configurations and both have played a role in improving the quality of circuit boards. While some companies opt for one technology...

Seam aperture leakage in aerospace enclosures.(EMC TEST)
March 1, 2009... When the discussions turn to severe aerospace applications, it's difficult to imagine one that is more severe than a launch vehicle/spacecraft combination. Here is a microwave systems platform operating at frequencies of 2,500 MHz and higher...