EE-Evaluation Engineering articles from March 2002

EE-Evaluation Engineering archives from March 2002

There is no other way. (Editorial).
March 1, 2002... With all the news lately about the wanton greed of upper-level management at some very large corporations, it's refreshing to read about an individual who has the moral principles to stand up for ethical business practices. It seems that a vice...

Analyzer assesses vehicle networks. (Product Briefing).
March 1, 2002... The ZonicBook[TM] Vibration Analyzer comes in four-, eight-, and 16-channel configurations. It accepts ICP[R] accelerometer and microphone inputs directly, simultaneously samples all channels at 51.2 kHz with a separate Sigma-Delta converter...

Systems perform four common safety tests. (Product Briefing).
March 1, 2002... System 3100 is an entry-level tester that comprises the company's Hypot[R] Ill Manual Hipot Tester and HYAMP[R] Ill Manual Ground Bond Tester. The system, available in three configurations, comes with the hardware and interconnetion cables for...

System integrates DC and RF measurements. (Product Briefing).
March 1, 2002... The Model S600DC/RF Automated Parametric Test (APT) System is used to test communications and high-speed digital devices at the wafer level. Compatible with 200-mm and 300-mm probers, the system integrates Anritsu's self calibrating vector...

Shock and Vibration Protection. (Dates).
March 1, 2002... The seminar series Design and Test for Shock and Vibration Protection will be held April 3 and April 10 at the Holiday Inn in Boxboro, MA, and April 17 at a nearby test lab. The series, developed by the Boston Chapter of the Institute of...

Environment and Contamination. (Dates).
March 1, 2002... The Institute of Environmental Sciences and Technology will hold ESTECH 2002, the 48th annual technical meeting and two-day exposition, concurrently with the ICCCS l6th International Symposium on Contamination Control on April 28-May 1 at the...

Corrigendum. (Dates).
March 1, 2002... On page 10 in the February issue of EE, the correct telephone number for the Versatest Series Model V4100 TDS Test Development System from Agilent Technologies is 866-283-8378, ext. 875.

Something new under the sun: With strict weight and performance criteria imposed by NASA, one company specializing in applied R&D electrochemistry answered the challenge with an innovative design for test systems. (Data Acquisition).
March 1, 2002... When you're flying 20 miles high, it's not the time to run out of gas. Such was the major challenge facing engineers developing an innovative fuel-cell-based power system during the design of Helios, the latest unmanned aerial vehicle (UAV)...

Methodizing functional test programs: Complete a test project even while the product is being developed? It's possible if you follow the generic approach outlined here. (Functional Test).
March 1, 2002... Often, there is a temptation to start writing test code before there are adequate test and process specifications, leading some to ask, "Why do we not have time to do it right, but we have time to do it over?" While there is a legitimate need...

Getting connected: Learn how fiber-optic connectors--the devices that link together much of the world-are rigorously tested in the qualification phase and during manufacturing. (Fiber-Optics Test).
March 1, 2002... Light is the currency of the fiber-optics industry, and losing light due to poor connections is of paramount concern. Fortunately, testing advancements have greatly aided the design and qualifications of fiber-optic connectors, resulting in the...

Innovative architecture distinguishes DSO. (Oscilloscopes).
March 1, 2002... The LeCroy Model 8500 WaveMaster DSO is actually new. Sure, it addresses the standard faster, wider, deeper issues just like everybody else, but the WaveMaster also gives you answers quickly. Try pursuing that concept with other long-memory...

Product Guide (A-W). (Instrumentation Buyers Guide).
March 1, 2002... Accessories, Instrumentation A.W. Sperry Instruments ACCES I/O Products Action Instruments Acumen Instruments Agilent Technologies Analogic Avtech Electrosystems Boonton Electronics C & H Technologies...

EMC engineering--A constant challenge: Here are three basic suggestions that can make EMC engineering more effective. (Dealing with EMC).
March 1, 2002... It isn't easy to be an EMC engineer in 2002. The unwanted RF generation and susceptibility of newly developed products, the life-blood of a modern electronics company, present constant challenges. "Semiconductor speeds are getting faster...

The multiple facets of DFT: New design tools make it easy to include the right level of DFT with minimal overhead. (Design for Testability).
March 1, 2002... Until recently, design for testability (DFT) had almost perfectly exemplified the conjunction of incongruous or contradictory terms: it was an oxymoron. Semiconductor companies acknowledged that they ranked DFT with unsettling concepts such as...

Static-Control bags are clean and cushiony: They've come a long way since pink poly hit the market in the 1960s, so find out here what today's static control bags have to offer you. (Coping with ESD).
March 1, 2002... With ever increasing operational speed and more functionality, newly developed electronic products are extremely sensitive to their surroundings. As a result, susceptibility to damage from Static discharge has become a critical issue, and...

Microwave switch plug-ins. (ATE).
March 1, 2002... The 1260-162A/B and 1260-164A/B are two-slot microwave switch cards designed for use in the Adapt-a-Switch[R] 1260-100 VXI carrier or the 1256 GPIB/RS-232 Switching Mainframe. They feature an 18-GHz bandwidth and switching life of more than one...

In-Circuit test system. (ATE).
March 1, 2002... The Z1888 Elite[TM] is a full-function, low-cost in-circuit test system designed for volume SMT production. It features the PRlSM-Z[TM] DSP-based analog measurement system, LightningZ[TM], integrated environments for adding flash and ISP...

Interconnect test tools. (Software).
March 1, 2002... A new release of the ScanWorks boundary scan test and in-system programming environment features next-generation interconnect test tools that offer better test coverage. The software also has seamless integration with Agilent Technologies' 3070...

Fault-Diagnosis software. (Software).
March 1, 2002... Agilent Fault Detective 2.0 automates functional test diagnostics of circuit boards and electronics subsystems during assembly and eliminates the time required for manual diagnoses. In use, the stand-alone software activates when a...

Programmable pulse generator. (Instrumentation).
March 1, 2002... The GP1550 Series Programmable Pulse Generators feature two 50-MHz output channels. The series has pulse widths from 10 ns to 10 s and delays from 0 ns to 10 s with up to 6-digit resolution. Output levels are adjustable from -10 V to 10 V with...

Vector signal generator. (Instrumentation).
March 1, 2002... The VG3000E/VG6000 Synthesized Vector Signal Generators are designed for IEEE 802.1 latest during wireless LAN development. The frequency ranges from 250 kHz to 3.2 GHz for the VG3000E and 4.96 to 6.2 GHz and 250 kHz to 3.2 GHz for the VG6000....

Company Guide (A-Z). (Instrumentation Buyers Guide).
March 1, 2002... A.W. Sperry Instruments NY 800-645-5398 fax: 631-434-3128 www.awsperry.com ACCES I/O Products CA 800-326-1649 fax: 858-550-7322 www.accesloproducts.com Acculogic Canada 905-475-5907 fax:...