EE-Evaluation Engineering articles from June 2008

EE-Evaluation Engineering archives from June 2008

Note taking on the wane.(EDITORIAL)
June 1, 2008... Listening to the speaker and taking notes at the same time during a seminar, lecture, or press event can be a daunting task, especially if you're like me and can't write rapidly or legibly. If I'm taking notes on something the speaker has said...

Flying-Probe system performs double-sided board tests.(PRODUCT BRIEFING)
June 1, 2008... The Takaya APT-9600 is a double-sided tester that features six flying probes, four on top and two on the bottom, which move simultaneously over and under the board-under-test. It addresses test coverage issues for boards with unique designs and...

Triple-output power supply stores 100 setups.(PRODUCT BRIEFING)
June 1, 2008... The 222-W benchtop XBT Power Supply Series features 16-bit programming with high-resolution setting and readback of voltage (1 mV) and current (100 (micro)A). Channels 1 and 2 are each programmable from ) to 32 V/0 to 3 A. The third output is...

Series features new scopes from 200 MHz to 2 GHz.(PRODUCT BRIEFING)
June 1, 2008... The M-Type Oscilloscope lineup now includes six models ranging from 200 MHz to 2 GHz. The scopes come with Wave Scan[TM], a search and analysis feature; WaveStream[TM], a viewing mode; and LabNotebook[TM], a documentation and report-generation...

PXI, PCI, and VXI scopes offer 300-MHz bandwidth.(PRODUCT BRIEFING)
June 1, 2008... The ZT4210 Series Oscilloscopes in PXI, PCI, and VXI form factors are available with two channels (ZT4211 PXI, PCI, and VXI) and four channels (ZT4212 VXI only). Key specifications include 300-MHz analog bandwidth, up to 1-GS/s real-time...

Signal analyzer software addresses LTE testing.(PRODUCT BRIEFING)
June 1, 2008... Three new software packages for the MS269xA Signal Analyzer Series support evaluation of 3GPP long term evolution (LTE) uplink and downlink signals. The software is installed directly on the analyzer, eliminating the need for an external PC in...

AOI platform qualified for all SMT line inspection.(PRODUCT BRIEFING)
June 1, 2008... The Medalist sj5000 Automated Optical Inspection Platform accommodates all areas of SMT line inspection including post-, pre-, and 2-D capabilities. It can inspect the smallest 01005 components as well as board sizes up to 20 x 20 inches. ...

Cross-bus analysis speeds troubleshooting.(LOGIC ANALYSIS)
June 1, 2008... Today's digital systems, from the video game console to the complex switching elements in a communications network, rely on serial bus technology to do their job. Not surprisingly, a host of application-specific serial buses has emerged. ...

Mobility performance testing.(FIXED-MOBILE CONVERGENCE)
June 1, 2008... The rich availability of Wi-Fi connectivity and the universal demand for constant access to voice and data communications are driving consumer and enterprise demand for converged Wi-Fi/ cellular applications and services. Under the banner of...

The new shape of SDR.(WIRELESS TEST)(software defined radio )
June 1, 2008... As DSPs and FPGAs be come ever more capable and general-purpose microprocessors sprout multiple and specialized cores, software defined radio (SDR) implementations are benefiting. In addition to greatly improved standard hardware components,...

Wiring tools handle complicated testing: product focus.(CABLE/HARNESS TEST)
June 1, 2008... Testing a single wire may be simple, but testing a complex assembly of wires is not. There's more required to test involved wire harnesses than purchasing a cable tester--this actually could be the simplest part. You need a systematic process...

Life after VB 6.(PROGRAMMING LANGUAGE)
June 1, 2008... With extended support for Visual Basic (VB) 6.0 nearing its end this year, many developers are looking for guidance on whether to upgrade, reuse, rewrite, or replace their legacy VB 6 code in favor of developing on supported software platforms....

Nanotechnology drives battery development.(NANOELECTRONICS TEST)
June 1, 2008... A few years ago, if you had been asked "What has nanotechnology done for you lately?", the answer could have been "not much." Today, the situation has changed considerably. Because nanosize materials behave differently than larger-scale...

Environmental Test Buyers Guide.(Buyers guide)
June 1, 2008... EE's annual Environmental Test Buyers Guide is a comprehensive, up-to-date listing of the companies that offer environmental testing products, equipment, and services. The guide is arranged in two sections. First is a product/company...

Ready for MIL-STD-461F testing?(FROM AN EMC ENGINEER'S NOTEBOOK)
June 1, 2008... In the beginning of a new-product lifecycle, a request for quotation (RFQ) is issued. Potential bidders examine the RFQ, see a section on EMC requirements, and decide to use an outside test vendor for support. A Web search results in many...