EE-Evaluation Engineering articles from July 2005

EE-Evaluation Engineering archives from July 2005

A new magazine.(EDITORIAL)
July 1, 2005... Over the past few months, you may have read a couple of articles published in EE that discussed a test and measurement interface based on industry standards IEEE 802.3 (Ethernet), IEEE 1588, and TCP/IP. In fact, many companies already have...

Aeroflex acquires UbiNetics Test and Measurement Division.(In The News)
July 1, 2005... Aeroflex, a designer, developer, and manufacturer of automated testing solutions and microelectronics for the aerospace, defense, and broadband communications markets, has completed the acquisition of the Test and Measurement Division (SPG) of...

Acterna acquired by JDS Uniphase Group.(In The News)
July 1, 2005... Acterna, a provider of broadband and optical test and management solutions for service providers and network equipment vendors worldwide, has been purchased by JDS Uniphase. Acterna, which employs approximately 1,770 people worldwide, will...

CIMTEK partners with software provider.(In The News)
July 1, 2005... CIMTEK, an electronics testing company that designs and builds testing equipment for complex electronic products, and PEER Group have partnered to provide centralized management and remote monitoring capabilities to companies with distributed...

Cognex acquires vision sensor manufacturer.(In The News)
July 1, 2005... Cognex, a supplier of machine vision systems, has acquired DVT, a provider of vision sensors primarily for the factoryfloor segment of the machine vision business. Cognex plans to maintain operations at DVT's current facility in Duluth, GA, and...

EOS/ESD Symposium.(Dates)
July 1, 2005... The 27th annual EOS/ESD Symposium will be held Sept. 11-16 at the Anaheim Marriott. Sponsored by the ESD Association in cooperation with the IEEE and technically cosponsored by the Electron Devices Society, the symposium addresses the effects...

VEE Pro 7.5 supports NI data acquisition hardware.(Product Briefing)(Buyers Guide)
July 1, 2005... The Visual Engineering Environment (VEE) Pro 7.5 Software now can access National Instruments' hardware products including PXI, SCXI, and PC plug-in data acquisition cards and modular instruments. It also adds seamless access to Microsoft Excel...

System tests 18 independent sites.(Product Briefing)(Buyers Guide)
July 1, 2005... The Kalos 2 Hex (K2 Hex) is an IC test system for current and next-generation nonvolatile memory and embedded devices. It provides the flexibility to easily switch between many different device types and between multisite testing and high...

Long-memory scopes perform 80+ measurements.(Product Briefing)(Buyers Guide)
July 1, 2005... The WavePro[TM] 7000A Series of digital oscilloscopes, designed with 10.4-inch SVGA touch screen displays, covers the 1-GHz to 3-GHz bandwidth range and features more than 80 standard measurements including timing and jitter. The sampling rate...

Test development software upgrades interface capabilities.(Product Briefing)(Buyers Guide)
July 1, 2005... TestPoint Version 6.0 brings a new look and feel to the test and measurement development software. The user interface upgrades include user-definable menu bars on the panels; an editor window structure with separate toplevel windows for menu,...

Logic Analyzers increase throughput by 300%.(Product Briefing)(Buyers Guide)
July 1, 2005... The TLA7012 Portable Mainframe and the TLA7016 Benchtop Mainframe Logic Analyzers are compatible with all TLA modules and can be combined for analyzing and debugging complex system problems. Both share TLA Application Software version 5.0...

Third dimension uncovers signal anomalies: the quality of an oscilloscope's display can make a big difference in your ability to troubleshoot your designs effectively.(OSCILLOSCOPES)
July 1, 2005... Engineers traditionally think of digital storage oscilloscopes (DSOs) as two-dimensional instruments that graphically display only voltage vs. time. But there actually is a third dimension to a scope: the Z-axis. This third dimension shows...

ATE implementations for multisite device test: a system architecture designed from the ground up for high-efficiency multisite test will minimize test costs for semiconductor manufacturers.(IC TEST)(Cover Story)
July 1, 2005... Hand-held consumer products, such as cellular phones and PDAs, are driving demand for system-on-a-chip (SOC) and system-in-a-package (SIP) devices. SOCs and SIPs contain multiple integrated functions and are designed to reduce device size and...

Making WLAN work to the letter of the spec: has your Wi-Fi rate slowed to lattes/Mb? Rediscover what fast is with 802.11a/g.(WIRELESS TEST)
July 1, 2005... Wireless LAN (WLAN) access points (APs) have liberated countless millions of road warriors, students, business people, and coffee-shop visitors from the shackles of hard-wired ports. At first, the basic 802.11 service seemed very good and...

Test pattern compression saves time and bits: test compression sounds like magic. Read on to learn how this trick is done.(DESIGN FOR TEST)
July 1, 2005... Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was only slowly adopted by designers until electronic design automation (EDA) companies provided tools that automatically...

8-slot 3U PXI/CompactPCI instrument chassis with power module.(Advertisement)
July 1, 2005... The PXIS-2630 Series is a 19" 3U PXI chassis providing seven PXI peripheral slots in a system. The chassis are compliant with the PXI and CompactPCI specifications and compatible with both PXI and CompactPCI modules. The PXIS-2630 is equipped...

6-slot 3U PXI/CompactPCI instrument chassis with power module.(Advertisement)
July 1, 2005... The PXIS-2506 is a 3U 6-slot portable PXI chassis with five PXI/CompactPCI peripheral slots. It is compliant with the PXI and CompactPCI specifications and can be used with both PXI and CompactPCI modules. The internal 10 MHz reference clock is...

A Series of multi-channel relay outputs & isolated DI cards.(Advertisement)
July 1, 2005... The PCI-725x Series of four cards supports a 32-bit 3.3V or 5V PCI bus and features relay output status read-back, on-board LED indicators for relay status and on-board relay driving circuits. The PCI-7250 and PCI-7251 provide 8-CH relay...

3U PXI Pentium M system controller with VGA/GbE/CF.(Advertisement)
July 1, 2005... The PXI-3800 is designed to meet the highest performance requirements for embedded computing. This system controller complies with PXI specifications Rev. 2.1 and features many new technologies such as up to 1.8 GHz Pentium[R] M CPU support,...

EMC Buyers Guide.(Directory)
July 1, 2005... When you need EMC products and services, you want to know what companies offer them and how to contact each one. EE's annual EMC Buyers Guide is just that--a comprehensive, up-to-date listing of the companies that provide EMC products and...

Chicago's Navy Pier to host EMC Symposium.(EMC SYMPOSIUM)
July 1, 2005... A well-blended mix of traditional and innovative experiences comprises the program for the 2005 IEEE International Symposium on Electromagnetic Compatibility Aug. 8-12 at the Navy Pier in Chicago. In addition to many familiar offerings, the...

McQ512 Trimmer Capacitor.(Advertisement)
July 1, 2005... Tusonix's smallest Miniature All-Ceramic Surface Mount Trimmer Capacitor--the McQ 512 Series--is offered in an incredibly compact size for those applications that demand high Q and space-saving solutions. The state-of-the-art McQ 512 Trimmer is...

30 Amp terminal blocks.(Advertisement)
July 1, 2005... Designers can eliminate unwanted EMI with Tusonix's UL Recognized Filtered Terminal Blocks, which have an increased current up to 30 Amps with a working voltage of 150V dc and capacitance values up to 15,000pF. Applying an existing design...

Ultra mini press-in filters.(Advertisement)
July 1, 2005... The ultra-miniaturized 4306 Press-In Ceramic EMI filter suppresses unwanted EMI and allows a fast, mechanical bonding that is free from soldering. And, by offering an excellent alternative to the traditional soldering installation, these finely...

Applying automated optical inspection: the goal is to develop an accurate, fast AOI system as flexible and easy to train as a human.(AUTOMATED OPTICAL INSPECTION)
July 1, 2005... Automated optical inspection (AOI) uses lighting, cameras, and vision computers to make precise, repeatable, high-speed evaluations of a wide range of products. Human vision has limited accuracy and is slow but very flexible and easy to train....

New architecture enhances memory test and repair: generic test and repair approaches to embedded memory have hit their limit.(MEMORY TEST AND REPAIR)
July 1, 2005... Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single chip. However, these newer technology nodes have contributed to complex design rules and expensive fab and mask costs. ...

Vacuum Probe Stations.(ATE)(Buyers Guide)
July 1, 2005... The VACP200 Programmable and the VACM200 Motorized Probe Stations, designed for use in a vibration isolation system, probe up to 8" wafers, pieces, die, or packaged parts. Features include a laser-ready microscope with a 40X zoom body and a 10X...

Quad-pin device.(ATE)(Buyers Guide)
July 1, 2005... The low-power, four-channel BiCMOS pin electronics E7804 IC for logic, memory, or mixed-signal ATE systems features tristatable drivers that operate up to 133 MHz at 3 V with very low propagation delay dispersions. It generates signals over a...

WAN analyzer.(COMMUNICATIONS TEST)(Buyers Guide)
July 1, 2005... The OptiView[TM] DS3/E3 WAN Analyzer combines packet capture, statistical analysis, and network discovery to provide data that optimizes traffic over purchased WAN connections. Frame relay, ATM, PPP, and HDLC technologies are supported, and...

10GbE Test Platform.(COMMUNICATIONS TEST)(Buyers Guide)
July 1, 2005... A new six-port, 10GbE test module provides 600-Gb/s full duplex or 1.2-Tb/s total bandwidth in one Optixia Test Platform. With the new module, the Optixia is suited for validating and testing next-generation Metro Ethernet and triple play...

USB-based modules.(DATA ACQUISITION)(Buyers Guide)
July 1, 2005... The Series KUSB-3100 consists of five multifunction modules. The KUSB-3100 and KUSB-3102 feature 12-b resolution and sampling rates of 40 kS/s and 100kS/s, respectively. The KUSB-3108 and KUSB-3116 modules have 16-b resolution and 50-kS/s and...

PXI-based Digitizer.(DATA ACQUISITION)(Buyers Guide)
July 1, 2005... The NI PXI-5922 Digitizer Module can be combined with NI LabVIEW 7.1 to create numerous types of instruments such as AC voltmeters, audio analyzers, frequency counters, spectrum analyzers, or I/Q modulation analyzers. It uses the NI Flexll ADC...

USB-based datalogger.(DATA ACQUISITION)(Buyers Guide)
July 1, 2005... The USB ADC-11 Data Logger supports fast sampling rates and additional digital outputs for use as control or alarm outputs. Two models, the USB ADC-11/10 (10 b) and the USB ADC-11/12 (12 b), measure up to 11 channels of voltage at up to 20,000...

Hipot testers.(INSTRUMENTATION)(Buyers Guide)
July 1, 2005... Two multifunction electrical safety compliance analyzers with 500-VA testing capability have been added to the Hypot-MAX[TM] family of automated dielectric withstand analyzers. Model 7700 features 5-kV AC hipot at 100 mA (500 VA), 6-kV DC hipot...

High-voltage Power Supplies.(INSTRUMENTATION)(Buyers Guide)
July 1, 2005... The PH220 200-W Line-Operated Power Supplies feature a semilinear sine-wave topology that exhibits very low noise and high-precision output characteristics. The first model in the series is rated at an output voltage of -1,500 VDC, but other...

Wideband amplifier.(INSTRUMENTATION)(Buyers Guide)
July 1, 2005... The Model 9250 is a dual-channel/differential stand-alone wideband amplifier that operates as an amplifying buffer for signals from waveform, function, or pulse generators. It is factory configurable as two separate amplifier channels with...

Semiconductor Technologies.(LITERATURE MARKETPLACE)
July 1, 2005... Keithley Instruments has published the first edition of Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF--From Modeling to Manufacturing. This 140-page tutorial handbook draws from the collective...

Low-cost Vibration Test Systems and Digital Controllers.(LITERATURE MARKETPLACE)
July 1, 2005... 100 lbf System $5,557 with Vibrator, base, blower, low-distortion linear amplifier, cables & hose. Digital Controller Packages convert PCs to Vibration Controllers--Sine $3,995. Random $4,995. 4-Channel Swept-Sine, Random & Classical Shock with...

Data Acquisition Systems.(LITERATURE MARKETPLACE)
July 1, 2005... The Data Acquisition Systems book is a handy, free reference that anyone working with data acquisition systems will want to have at their fingertips. It features up-to-date information on current data acquisition technology, digital...

Graphical development environment.(LITERATURE MARKETPLACE)
July 1, 2005... NI LabVIEW is the graphical development environment for creating flexible and scalable test, measurement, and control applications, rapidly, and at minimal cost. With LabVIEW, engineers and scientists interface with real-world signals, analyze...

Communications test equipment.(LITERATURE MARKETPLACE)
July 1, 2005... Aeroflex's new short-form catalog and CD makes finding a test solution quick and easy. The listing includes solutions for communications, cellular parametric, protocol and conformance, military and avionics test; RF signal generators; PXI...

Electrical safety tester.(LITERATURE MARKETPLACE)
July 1, 2005... The 4320 is a new 4-in-1 electrical safety tester from Slaughter Company, Inc. The 4320 provides AC hipot, DC hipot, insulation resistance, and ground bond testing in a single feature-rich and low-cost instrument. With its multifunction...

Safety compliance analyzer.(LITERATURE MARKETPLACE)
July 1, 2005... The OMNIA[R] 8100 Series is the most complete electrical safety compliance analyzer available today. OMNIA is available in three separate models providing 4-in-1, 5-in-1, and 6-in-1 electrical safety testing and so advanced that it holds eight...

Leak current tester.(LITERATURE MARKETPLACE)
July 1, 2005... The 3156 Leak Current HiTESTER is a single unit capable of measuring leak current in compliance with the IEC, UL, and JIS standards. It includes built-in networks simulating human resistance according to the above specifications. One unit can...

PXI cards.(LITERATURE MARKETPLACE)
July 1, 2005... Digalog Systems brings its 30+ years of test innovation to the PXI market with an expanding line of instrumentation cards, in stock for immediate shipment. In stand-alone solutions or as part of Digalog's integrated 2050 Test System, these...

Adhesives and sealants.(LITERATURE MARKETPLACE)
July 1, 2005... Master Bond Inc., Hackensack, NJ, manufactures more than 3,000 grades of adhesives, sealants, and coatings. Line consists of epoxies, anaerobics, cyanoacrylates, silicones, and acrylics. One- and two-part systems are available. Master Bond...

ESD testing of explosives.(LITERATURE MARKETPLACE)
July 1, 2005... ESD testing of explosive devices to military and international standards is safer with EMC-PARTNER TC-MIG24, ESD-EXT and ESD-SAFETY SWITCH, accessories to the ESD3000 Test System. Damage to equipment reduced with the ESD-EXT; residual ESD...

Custom EMI filters.(LITERATURE MARKETPLACE)
July 1, 2005... Captor custom-designs EMI filters to control interference on power, data transmission and signal lines, often in difficult environments. Colorful 6-page brochure covers engineering, testing, and production of these complex filters, as well as a...

Used equipment auctions.(LITERATURE MARKETPLACE)
July 1, 2005... Auctions and classified ads for new and used test equipment. [ILLUSTRATION OMITTED] * Over 100,000 Items * Buy and sell with 75,000 Members * Need equipment? FREE Want Ads LabX, 888-781-0328 http://test.labx.com ...

DC supplies.(LITERATURE MARKETPLACE)
July 1, 2005... Designed for use in ATE systems, the 62000P Series Programmable DC Power Supplies can source combinations of high/low voltage and current at constant power. The supplies also can provide complex dc transient waveforms to test for voltage...

Probe and field monitor.(LITERATURE MARKETPLACE)
July 1, 2005... The brochure features an overview of the new line of field monitoring equipment. It highlights the Starprobe[TM], AR Worldwide's laser powered probe; the Starmonitor[TM], a revolutionary new field monitor; and six new E and H field probes that...

Transient immunity testing.(LITERATURE MARKETPLACE)
July 1, 2005... A 38-page engineering guide on transient immunity testing now is available from Schaffner EMC. The handy reference guide describes the mechanisms involved in generating transients and tests that have been developed to deal with them to help...

Led testing.(LITERATURE MARKETPLACE)
July 1, 2005... The Smart FINN[TM] is a unique tool delivering highly accurate full color and intensity readings for a broad range of LEDs. Smart FINN is suitable for use in any test environment. Learn about its operation, applications, and features and find...