EE-Evaluation Engineering articles from January 2009

EE-Evaluation Engineering archives from January 2009

To help you stay informed.(Editorial)
January 1, 2009... As we start the new year, I'd like to give our readers a look at some of the interesting things you can expect from EE in the coming months. No, we are not changing the editorial focus of EE. As the pioneering test magazine, you will continue...

266-MHz system tests MCP/flash devices.(PAUL'S PICKS)(Advantest America Inc.)(multi chip packages)(Brief article)
January 1, 2009... The T5782 Memory Test System provides speeds of 266 MHz/533 Mb/s for multi-chip packages, flash memories, and memory-embedded microcontrollers. The system, designed with per-site architecture, simultaneously tests up to 256 devices and...

Software addresses challenge of memory management in C.(PAUL'S PICKS)(National Instruments Corp.)(Brief article)
January 1, 2009... LabWindows/CVI 9.0, the latest version of the ANSI C development environment for building test and measurement solutions, includes an improved compiler and debugger. Engineers can expect a 20% to 50% improvement in large application compile...

Multifunction board handles embedded applications.(PAUL'S PICKS)(Data Translation Inc.)(Brief article)
January 1, 2009... The DT9818 Data Acquisition Board for embedded applications runs on USB power while simultaneously offering [+ or -]500-V galvanic isolation. It provides eight or 16 analog inputs, two analog outputs, 16 digital I/O lines, two counter/timers,...

Module combines JTAG/boundary scan and functional test.(PAUL'S PICKS)(Goepel Electronic GmbH)(Brief article)
January 1, 2009... The PXI 5396-x Series of JTAG digital modules supports the structural JTAG/boundary scan test as well as dynamic I/O operation up to 100 MHz to execute functional tests. All modules offer 96 single-ended channels configurable as input, output,...

Enhanced platform simplifies I-V characterization.(PAUL'S PICKS)(Keithley Instruments Inc.)(Brief article)
January 1, 2009... The Series 2600A, newest version of the company's SourceMeter[R] platform, combines a precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger control....

LXI Class C digitizers provide scope-like measurements.(PAUL'S PICKS)(Agilent Technologies Inc.)(Brief article)
January 1, 2009... The Agilent L4532A and L4534A are stand-alone high-resolution digitizers featuring LXI connectivity. The two-channel L4B32A and the four-channel L4534A offer simultaneous sampling at up to 20 MS/s with 16-bit ADC resolution. Isolated input...

Two LXI chassis accept 3U switching modules.(PAUL'S PICKS)(Pickering Interfaces)(Brief article)
January 1, 2009... The 60-102 and 60-103 are seven-and 18-slot modular LXI chassis that accept products chosen from more than 500 of the company's 3U PXI modules. This includes a range of switching modules with additional test functions such as programmable power...

Portable scopes feature bandwidths up to 200 MHz.(PAUL'S PICKS)(Tektronix Inc.)(Brief article)
January 1, 2009... The new MSO2000 Mixed-Signal and DPO2000 Digital Phosphor Oscilloscopes feature Wave Inspector [R] search and navigation tools, automatic decoding of serial data buses, and Filter Vu [TM] variable low-pass filters to reduce noise from signals....

ATE platform tests both flash and DRAM.(PAUL'S PICKS)(Verigy)(dynamic random access memory)(Brief article)
January 1, 2009... The V6000 tests both flash and DRAM on the same ATE platform by changing to a new test program and probe card. All V6000 systems include the company's patent-pending Active Matrix[TM] technology and sixth-generation Tester-Per-Site[R]...

USB 3.0 physical layer measurements.(DATA ACQUISITION)(universal serial bus)
January 1, 2009... If your company is at the forefront of the PC industry, by now you are probably aware that USB 3.0 is here. Controller chips are starting to ship, and you are already dealing with design issues around the specification. To meet...

Selecting your optimum LXI feature set.(LXI Connexion)
January 1, 2009... More than a year ago, a few suppliers of LXI instruments were starting with LXI Class C to develop enhanced instruments. (1) Class C makes up the core LXI features on which Class B and A instruments are built. (2) Now the LXI Consortium has...

Can you really measure 154.263 ps?(OSCILLOSCOPES)
January 1, 2009... A modern DSO does a lot more than just display waveforms. A particularly useful and timesaving feature is built-in waveform measurement. While you're viewing the signal of interest, parameters are displayed that you have selected from a list....

Redefining memory test.(IC ATE)
January 1, 2009... Memory device markets are more uncertain today than perhaps they have been in their entire history. In manufacturing, uncertainty can be addressed by equipment that can scale to needs and is flexible to adapt to changes in products. In the...

Stressed-out data buses.(COMMUNICATIONS TEST EQUIPMENT)
January 1, 2009... If you need to transfer data at rates above a couple hundred megahertz, use a serial link. There are several to choose among including the many Ethernet versions, PCI-Express (PCIe), SAS, SATA, USB, and Display-Port. Most of these standards...

Services guide.(TEST LABS/SERVICES BUYERS GUIDE)(List)
January 1, 2009... Acoustic Analysis Hermon Laboratories Intertek IQS, Division of Degree Controls National Technical Systems Oneida Research Services OnSpeX Quanta Laboratories Quest Engineering Solutions Raytheon...

Company guide.(TEST LABS/SERVICES BUYERS GUIDE)(Directory)
January 1, 2009... A.T.E. Solutions CA 310-822-5231 www.besttest.com Accolade Engineering Solutions CA 949-597-8378 www.accoladeeng.com Advanced Compliance Solutions GA 770-831-8048 www.acstestlab.com Aero Nav...

Conducted Susceptibility Testing.(EMC TEST)
January 1, 2009... Low-frequency signals appearing on the power lines--so what? The level is low relative to the primary power for an AC-powered device. And DC-powered systems are designed to function with wide variance in the input voltage, so why bother? ...