EE-Evaluation Engineering articles from January 2008

EE-Evaluation Engineering archives from January 2008

Not just a magazine anymore.(EDITORIAL)
January 1, 2008... I'm sure many of you never looked at the words just under the month and year on the cover of this publication. You probably haven't noticed the tag line (that's what we call those words) on other magazines either. Not to keep you in suspense,...

1-GHz scopes address design validation.(PRODUCT BRIEFING)(Brief article)
January 1, 2008... Two M-Type 1-GHz oscilloscopes, the WaveRunner MXi and the WaveSurfer MXs, bring a large display/small footprint form factor and a 5-GS/s sampling rate to 1-GHz oscilloscopes. Each oscilloscope comes with a set of analysis tools including...

Microwave Signal Generator features 100-[micro]s switching speed.(PRODUCT BRIEFING)(Brief article)
January 1, 2008... The MG37020A Microwave Signal Generator uses a VCO-based hardware architecture to achieve switching speed of 100 [micro]s/point while maintaining low phase noise of typically--101 dBc/Hz at 10-kHz offset at 10 GHz. It covers a frequency range...

Portable spectrum analyzer operates up to 7.5 GHz.(PRODUCT BRIEFING)(Brief article)
January 1, 2008... The hand-held 9103 Spectrum Analyzer accommodates frequencies up to 7.5 GHz and supports microwave applications in addition to the typical measurements of standard desktop spectrum analyzers. Additional measurements such as tracking...

Software release improves in-system programming.(PRODUCT BRIEFING)(Brief article)
January 1, 2008... Release 4.4.1 of the SYSTEM CASCON[TM] software platform enhances in-system programming and third-party ATE integration. It also provides new and improved tools for automated handling of non-boundary scan components and clusters including...

Expanded USB DAQ family configures simple waveforms.(PRODUCT BRIEFING)(Universal Serial Bus data acquisition)(Brief article)
January 1, 2008... Additions to the Agilent USB DAQ family of stand-alone, modular solutions, bundled with Modular Instruments Measurement Manager software, configure, acquire, and generate simple function or arbitrary waveforms. With the included IVI-driver,...

Tool advances existing at-speed test methods.(PRODUCT BRIEFING)(Brief article)
January 1, 2008... The TetraMAX[R] Small Delay Defect Automatic Test Pattern Generator (ATPG) produces manufacturing test vectors and creates tests for complex and multimillion gate designs. It is optimized for a range of test methodologies integrated with the...

Controllers extend multicore to PXI and PXI Express systems.(PRODUCT BRIEFING)(PCI extensions for instrumentation)(Brief article)
January 1, 2008... The NI 8352 and NI 8353 Controllers for PXI or PXI Express systems assist in achieving sustainable I/O bandwidth of up to 832 MB/s when bundled with an MXI-Express kit. They have up to four 250-GB hard drives with a maximum capacity of 1 TB and...

Series launches pulse/waveform generator combination.(PRODUCT BRIEFING)(Tabor Electronics Inc. )(Brief article)
January 1, 2008... The Pulse Master Series PM8571 and PM8572 are 50-MHz single- and dual-channel pulse/pattern generators that execute commands to emulate nearly all new and discontinued pulse generators on the market. They also produce a range of standard,...

Eight hints for better scope probing.(OSCILLOSCOPES)
January 1, 2008... Probing is critical to making quality oscilloscope measurements, and often the probe is the first link in the oscilloscope measurement chain. If probe performance is not adequate for your application, you will see distorted or misleading...

Wireless sensor networks are taking over.(DATA ACQUISITION)
January 1, 2008... For military surveillance, a self-organizing network of minute, autonomous wireless sensors is very attractive. Once a group of nodes has been deployed, perhaps dropped by air, troop and vehicular movements can be remotely monitored. The...

Reducing EVM test time and identifying failure mechanisms.(IC ATE)(Error vector magnitude)
January 1, 2008... Error vector magnitude (EVM) is slowly becoming a mainstream production test. The reason? New and emerging standards utilizing complex digital modulation will require a system-level test to ensure all radios are on and functioning properly....

Making RF-to-baseband Noise Figure Measurements.(NOISE FIGURE MEASUREMENTS)
January 1, 2008... RF-to-baseband front ends consisting of a low-noise amplifier (LNA) cascaded with a mixer down-converting RF signals to baseband have become the epitome of RF devices tested in high-volume manufacturing (HVM) today. While the methodologies for...

Why use one radio when four will do?(WIMAX TESTING)(multiple-input multiple-output )
January 1, 2008... Which multiple-input multiple-output (MIMO) test methods are most appropriate depends on the purpose of the testing. Manufacturing test needs to determine that an assembly has been correctly built because satisfactory operation is guaranteed by...

Keeping pace with user requirements.(EMC SHIELDING APPLICATIONS)
January 1, 2008... Although it might appear that EMC shielding is a mature technology with little change and that application techniques are likewise stable, such is far from the case. Application requirements continue to change, and EMC suppliers are taking...

Test Labs/Services Buyers Guide.(Directory)
January 1, 2008... EE's 39th annual Test Labs/Services Buyers Guide is a comprehensive, up-to-date listing of the companies that offer testing and consulting services to the electronics industry. The guide is arranged in two sections. First is a...