EE-Evaluation Engineering articles from February 2004

EE-Evaluation Engineering archives from February 2004

Your job and career.(Editorial)
February 1, 2004... Did you not receive a reasonable raise in 2003 or, worse yet, no increase at all? Was there no bonus in your year-end paycheck? Are you dissatisfied with your present job? Will 2004 be the year you look for another job? [ILLUSTRATION...

Communications Analyzer provides jitter subcomponent capability.(Product Briefing)
February 1, 2004... The 86100C Infiniium Digital Communications Analyzer with one-button jitter analysis (DCA-J) separates random and deterministic jitter and their subcomponents at rates from 50 Mb/s to 40 Gb/s. Measurements include total jitter (TJ), random...

Tester makes simultaneous DC and RF measurements.(Product Briefing)
February 1, 2004... The S680DC/RF Parametric Test System features simultaneous independent DC and RF tests at up to 40 GHz on separate probes. The system's source-measure units (SMUs) have been improved by adding faster, more flexible digital communications for...

Spectrum Analyzer addresses time-varying signals.(Product Briefing)
February 1, 2004... Four models of the RSA2200A Series and RSA3300A Series Real-Time Spectrum Analyzers provide time-correlated display of the time, frequency, and modulation domains. [ILLUSTRATION OMITTED] Signal bandwidth is 10 MHz to 3 GHz on the 2203A...

PXI Switch Modules increase relay density.(Product Briefing)
February 1, 2004... The PXI-2530, the SCXI-1130, the PXI-2529, the PXI-2567, and the SCXI-1167 Switch Modules address a range of applications to meet ATE design needs. They all work with NI LabVIEW graphical development environment and NI Switch Executive switch...

Supporting legacy test systems.(PC-Based Test)
February 1, 2004... The world of electronics test has progressed rapidly during the past quarter century. Most of the automated test systems from the late 1970s were replaced more than 15 years ago. However, some mission-critical test systems in use today still...

PC-Based Test Buyers Guide: product guide.
February 1, 2004... EE's PC-Based Test Buyers Guide is a comprehensive, up-to-date listing of the companies that manufacture PC-based test products. The guide is arranged in two sections. First is a product/company cross-reference. The second section is an...

PC-Based Test Buyers Guide: company guide.
February 1, 2004... ACCES I/O Products CA 800-326-1649; fax: 858-550-7322 www.accesio.com Acculogic Canada 905-475-5907; fax: 905-475-5415 www.acculogic.com Acqiris USA NY 845-782-6544; fax: 845-782-4745 www.acqiris.com ...

Resisting the flow.(DMMs)
February 1, 2004... How accurately do you need to measure an unknown resistance? Is it enough to know that a resistor's value is greater than 1 M[ohm], or must you know the value to five decimal places? The answer determines the measurement cost and the technique...

3-D techniques in SMT test.(Inspection)
February 1, 2004... Human vision and perception of the world rely on the ability to view objects as the three-dimensional (3-D) structures they are. Perceiving depth, distance, and an object's curvature and surface relies on the human ability to translate two...

Encouraging and managing innovation.(Manager's Forum)
February 1, 2004... Engineers are natural innovators, expected to turn out novel products for diverse marketing opportunities within the framework of a company's business model. However, the engineering organization must reinforce this innovative spirit and get...

Rating power amplifiers for RF immunity testing.(EMC Test Equipment)
February 1, 2004... Over the years, tutorials have appeared in EMC journals explaining how to estimate the power required from a power amplifier intended for use in an RF immunity test system. Little material, if any, has explored the issue of gain compression in...

Predicting spreading codes of code spurs.(Wireless Test)
February 1, 2004... The capability to predict the spreading codes of code spurs generated by transmission nonlinearities can provide significant benefits in code division multiple access (CDMA) system operation. Typical nonlinearities that create code spurs are...

ATE: Boundary Scan Controllers.(New Products)
February 1, 2004... The Cheetah[TM] Boundary Scan Controllers deliver levels from 0.8 V to 5 V and TCK rates of up to 125 MHz. They feature a built-in 32-b dedicated processor, multipage DDR memory, and Adaptive Clocking Technology[TM]. The controllers, available...

ATE: boundary scan accessories.(New Products)
February 1, 2004... The FXT/96 Module in the CION[TM] family of boundary scan accessories provides 96 I/O channels with I/O voltage programmable between 1.8 V and 5 V for three groups of 32 channels. Each channel can be configured independently as input, output,...

ATE: mixed-signal evaluation system.(New Products)
February 1, 2004... The JTAG-1149.4 Explorer[TM] is an evaluation system featuring a sample mixed-signal application board and a boundary-scan controller. The software tool's GUI allows you to select components or specific analog nodes and conduct embedded analog...

ATE: 18-slot PXI Chassis.(New Products)
February 1, 2004... The CompactPCI-compatible, 18-slot PXI-1045 Chassis is designed for test and measurement applications requiring software-configurable triggering, high channel counts, and tight synchronization between high-performance modular instruments. It...

Instrumentation: supply with Ethernet interface.(New Products)
February 1, 2004... The ePower Series Power Supplies incorporate a 10/100 Ethernet/Fast Ethernet interface for remote control from a LAN, WAN, or the Internet. More than 60 models are available. The bench or rack-mountable, single-output units come in power levels...

Instrumentation: hand-held recorder.(New Products)
February 1, 2004... The rugged, hand-held Dash 2EZ Data Acquisition Recorder features a 5.7" color, real-time, high-resolution display for waveform viewing; touch-screen control; Compact Flash memory; and a 3" thermal printer for printing real-time and captured...

Instrumentation: Sine/Square Wave Generator.(New Products)
February 1, 2004... The Model 3003 10-MHz Sine and Square Wave Generator delivers DC to 10-MHz waveforms with a frequency accuracy of 0.02% and 0.1-Hz settability. The compact unit uses an external AC adapter or a standard 9-V battery for power....

Instrumentation: oscilloscope/DMM combination.(New Products)
February 1, 2004... The MultiScope[TM] Model 381285 combines a hand-held graphical storage oscilloscope with a true rms multimeter to observe actual voltage waveforms. The unit features a DC to 5-MHz oscilloscope with a sample rate of 25 million samples/s. Up to...

Software: Design/manufacturing link.(New Products)
February 1, 2004... Encounter[TM] Test Solutions comprises two products. The Encounter Test Design Edition includes automated DFT insertion; capacity for designs with >50 million gates; memory BIST; embedded core test; test compression with x-state masking; and...

Software: Test-Point analysis.(New Products)
February 1, 2004... The Test Point Analyzer helps prepare PCBs for in-circuit test earlier in the product-development cycle. The tool finds untestable nets based on user-defined test-point rules, test points blocked by components, and opportunities to simplify...